• DocumentCode
    3577818
  • Title

    Considerations on highly scalable and easily stackable phase change memory cell array for low-cost and high-performance applications

  • Author

    Dae-Hwan Kang ; Song Yi Kim ; Sang Su Park ; Sung Ho Eun ; Jong Whan Ma ; Jae Hyun Park ; Il Mok Park ; Kyu Sul Park ; Jaehee Oh ; Zhe Wu ; Jaehee Oh ; Zhe Wu ; Jeong Hee Park ; Sug Woo Jung ; Ho Kyun Ahn ; Youngsoo Lim ; Sung-Rae Cho ; Gi-Tae Jeong ; Don

  • Author_Institution
    Semicond. R&D Center, Samsung Electron. Co. Ltd., Hwasung, South Korea
  • fYear
    2014
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Needs for the performance improvement of memory subsystem in big data and clouding computing era begin to open new markets for emerging memories such as phase change memory, spin-torque-transfer magnetic memory, and metal oxide memory. To fulfill these needs, a cost-effective and high-speed phase change memory cell scheme was introduced at 19nm technology node, which is directly scalable down to 1y or 1z nm nodes and can be extendable to stacked array for higher density. Here, key technologies such as self-aligned cell patterning and vertical poly-Si diode switch on metal word line were adopted. In addition, damascene Ge-Sb-Te technologies were optimized to improve programming speed and to show excellent cell performances.
  • Keywords
    elemental semiconductors; integrated circuit design; integrated circuit reliability; magnetic storage; phase change memories; silicon; Si; clouding computing; data computing; memory subsystem; metal oxide memory; metal word line; phase change memory cell array; self-aligned cell patterning; size 19 nm; spin-torque-transfer magnetic memory; vertical poly-Si diode switch; Arrays; Phase change materials; Phase change random access memory; Reliability; Switches; Damascene Ge-Sb-Te technologies; memory subsystem; phase change memory; poly Si diode; self-aligned cell patterning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Non-Volatile Memory Technology Symposium (NVMTS), 2014 14th Annual
  • Print_ISBN
    978-1-4799-4203-9
  • Type

    conf

  • DOI
    10.1109/NVMTS.2014.7060836
  • Filename
    7060836