• DocumentCode
    3577827
  • Title

    3-bit read scheme for single layer Ta2O5 ReRAM

  • Author

    Schonhals, A. ; Waser, R. ; Menzel, S. ; Rana, V.

  • Author_Institution
    Inst. of Mater. in Electr. Eng. & Inf. Technol. II (IWE-2), RWTH Aachen Univ., Aachen, Germany
  • fYear
    2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Complementary switching mechanism allows for distinguishing between different physical orientations of the conductive filament. In addition to the multilevel capability of single layer Ta2O5 devices, 3-bit information can also be stored and read in a single device. In this report, we present a novel read scheme, allowing for distinguishing 8 different states only by using 4 different resistive states with the pulse measurements. Variability and cycle-to-cycle stability of the single layer Ta2O5 complementary switching are also discussed in details.
  • Keywords
    resistive RAM; tantalum compounds; ReRAM; Ta2O5; complementary switching mechanism; conductive filament; cycle-to-cycle stability; pulse measurements; word length 3 bit; Atmospheric measurements; Electrical resistance measurement; Electrodes; Pulse measurements; Resistance; Switches; Voltage measurement; complementary switching (CS); multilevel; pulse read; resistive switching memory (ReRAM); tantalum oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Non-Volatile Memory Technology Symposium (NVMTS), 2014 14th Annual
  • Print_ISBN
    978-1-4799-4203-9
  • Type

    conf

  • DOI
    10.1109/NVMTS.2014.7060845
  • Filename
    7060845