DocumentCode :
3577827
Title :
3-bit read scheme for single layer Ta2O5 ReRAM
Author :
Schonhals, A. ; Waser, R. ; Menzel, S. ; Rana, V.
Author_Institution :
Inst. of Mater. in Electr. Eng. & Inf. Technol. II (IWE-2), RWTH Aachen Univ., Aachen, Germany
fYear :
2014
Firstpage :
1
Lastpage :
4
Abstract :
Complementary switching mechanism allows for distinguishing between different physical orientations of the conductive filament. In addition to the multilevel capability of single layer Ta2O5 devices, 3-bit information can also be stored and read in a single device. In this report, we present a novel read scheme, allowing for distinguishing 8 different states only by using 4 different resistive states with the pulse measurements. Variability and cycle-to-cycle stability of the single layer Ta2O5 complementary switching are also discussed in details.
Keywords :
resistive RAM; tantalum compounds; ReRAM; Ta2O5; complementary switching mechanism; conductive filament; cycle-to-cycle stability; pulse measurements; word length 3 bit; Atmospheric measurements; Electrical resistance measurement; Electrodes; Pulse measurements; Resistance; Switches; Voltage measurement; complementary switching (CS); multilevel; pulse read; resistive switching memory (ReRAM); tantalum oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Non-Volatile Memory Technology Symposium (NVMTS), 2014 14th Annual
Print_ISBN :
978-1-4799-4203-9
Type :
conf
DOI :
10.1109/NVMTS.2014.7060845
Filename :
7060845
Link To Document :
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