Title :
An intelligent and reusable verification platform based on UVM for RFID digital baseband
Author :
Chang Liu ; Zheng Xie ; Jiting Su ; Qingqing Liu ; Xin´an Wang
Author_Institution :
Key Lab. of Integrated Microsyst., Peking Univ., Shenzhen, China
Abstract :
The verification kit for RFID system based on hardware is difficult for engineers to debug. Therefore, in this paper an intelligent verification environment for RFID using UVM is built to improve efficiency. Firstly, a design of RFID digital baseband is introduced. Then an intelligent structure based on UVM and comprised of four test modes is presented. With the aspect-oriented and transaction level modeling, a reusable verification with high efficiency has been achieved.
Keywords :
aspect-oriented programming; formal verification; radiofrequency identification; telecommunication computing; RFID digital baseband; RFID system; UVM; aspect-oriented modeling; intelligent structure; intelligent verification environment; intelligent verification platform; reusable verification platform; transaction level modeling; universal verification methodology; Indium tin oxide; Registers; RFID; UVM; reusability; test mode; verification;
Conference_Titel :
Electron Devices and Solid-State Circuits (EDSSC), 2014 IEEE International Conference on
DOI :
10.1109/EDSSC.2014.7061068
