A novel loss evaluation method for differential transmission lines

This paper proposes a novel loss evaluating method considering coupling effects based on a parallel RLC differential transmission line (DTL) model in nanometer CMOS process. Through extracting the coupling parasitical parameters, the decoupling partial differential equations of transmission lines are established, thus a loss evaluating expression is proposed. The analytical method enables the estimation of the loss within 6.48% average error compared with measured results in 180nm CMOS process and 5.20% average error compared with HFSS simulation in 65nm CMOS process.