• DocumentCode
    3577995
  • Title

    Unusual latch-up phenomenon and a novel solution without an additional cost

  • Author

    Suzuki, Teruo ; Tomita, Mitsuhiro ; Tajima, Shogo

  • Author_Institution
    Adv. Technol. Dev. Dept., Fujitsu Semicond. Ltd., Tokyo, Japan
  • fYear
    2014
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    An unusual latch-up phenomenon in a microcontroller with a built-in flash memory was detected. The root cause was identified by TCAD simulation and the latch-up mechanism was explained. A novel solution without additional cost was proposed. After applying this solution, the latch-up immunity was dramatically improved.
  • Keywords
    flash memories; microcontrollers; technology CAD (electronics); TCAD simulation; built-in flash memory; microcontroller; unusual latch-up phenomenon; Bipolar transistors; Earth Observing System; Microcontrollers; Read only memory; TCAD; latch-up; microcontroller with built-in flash memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Solid-State Circuits (EDSSC), 2014 IEEE International Conference on
  • Type

    conf

  • DOI
    10.1109/EDSSC.2014.7061071
  • Filename
    7061071
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3577995