Title :
The Analysis on Transient-Induced Latch-up in output driver circuit
Author :
Qi Jiang ; Huihui Yuan ; Yang Wang ; Xiangliang Jin
Author_Institution :
Eng. Lab. for Microelectron., Optoelectron. & Syst. on a Chip, Xiangtan Univ., Xiangtan, China
Abstract :
The occurrence of transient induced latch up (TLU) in output driver circuits is studied. A RS485 transceiver fabricated by a 0.5-μm CMOS process was used for a test chip, and the reason for TLU be induced in output driver circuit is analyzed in this paper, the latch-up and EMMI tests are taken to confirm the reason and position of latch-up.
Keywords :
CMOS logic circuits; driver circuits; flip-flops; logic testing; network analysis; transceivers; CMOS process; EMMI tests; RS485 transceiver; TLU; emission microscope; output driver circuit; size 0.5 mum; test chip; transient-induced latch-up; Substrates; Transceivers; RS485; Transient induced latch up (TLU); output driver; reliability test;
Conference_Titel :
Electron Devices and Solid-State Circuits (EDSSC), 2014 IEEE International Conference on
DOI :
10.1109/EDSSC.2014.7061158
