Title :
The fluorescence transformation characteristics research of the CsI(Tl) thin film
Author :
Zhang Hongliu ; Liu Shuang ; Guo Lina ; Chen Jing ; Li Yao ; Zhong Zhiyong
Author_Institution :
State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China (UESTC), Chengdu, China
Abstract :
This article proposed a new X-ray detector structure using Al as the separation and protection material based on thin layer CsI(Tl) crystal arrays coupled CCD. In this paper, an improved physical model is established, based on which a comprehensive discussion was performed on transmission and conversion factor of various types of fluorescence throughout the process of excitation and transfer. The results showed that, the crystal column´s best diameter is generally in 10um magnitudes.
Keywords :
X-ray apparatus; X-ray detection; charge-coupled devices; fluorescence; solid scintillation detectors; thin films; CCD; X-ray detector structure; conversion factor; crystal column; excitation process; fluorescence transformation characteristics research; improved physical model; protection material; thin layer CsI(TI) crystal arrays; transfer process; transmission factor; Biomedical imaging; Fluorescence; Radiography; X-ray imaging; CsI(Tl) film; Integrated directly; X-ray Detection; fluorescence conversion factor;
Conference_Titel :
Electron Devices and Solid-State Circuits (EDSSC), 2014 IEEE International Conference on
DOI :
10.1109/EDSSC.2014.7061208
