DocumentCode
3578135
Title
Novel comparator integrated charge pump phased locked loop to eliminate start-up issue
Author
Agarwal, Sanjay ; Mahesh, N. ; Singh, Sarvesh
Author_Institution
Timing Solution, Cypress Semicond., Cypress, CA, USA
fYear
2014
Firstpage
1
Lastpage
2
Abstract
Noise coupling at various nodes within the loop during start-up is one of the reasons that make PLL not to start-up or lock within specified lock time. Therefore a robust PLL design is required to counter these effects of noise. In this paper the novel comparator integrated charge pump PLL is discussed. Simulation and characterization were performed to observe the integrated PLL behavior across voltage and temperature. The programmable PLL was designed for reference input clock of 10 to 30MHz and maximum output frequency of 100MHz. Internal nodes of the chip were probed to observe the behavior of individual blocks (Comparator, Phase frequency detector, Charge pump, VCO and P/Q dividers) of the integrated charge pump PLL chip. Comparing the characteristics with the conventional PLL, the proposed PLL showed no lock time and start-up issue in the presence of noise at VCO output and feedback dividers.
Keywords
charge pump circuits; comparators (circuits); integrated circuit design; phase detectors; phase locked loops; voltage-controlled oscillators; VCO; comparator integrated charge pump phased locked loop; frequency 10 MHz to 30 MHz; frequency 100 MHz; integrated charge pump PLL chip; noise coupling; phase frequency detector; reference input clock; Charge pumps; Clocks; Logic gates; Noise; Phase frequency detector; Phase locked loops; Voltage-controlled oscillators; Charge Pump (CP); Phase Frequency Detector (PFD); Phase Locked Loop (PLL); Voltage Controlled Oscillator (VCO);
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices and Solid-State Circuits (EDSSC), 2014 IEEE International Conference on
Type
conf
DOI
10.1109/EDSSC.2014.7061211
Filename
7061211
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