Title :
A special higher-order finite element method for scattering by large cavities
Author :
Jian Liu ; Jian-Ming Jin
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
Abstract :
Numerical computation of the radar cross section (RCS) of a large, deep open cavity is considered a very challenging problem in computational electromagnetics. A very efficient numerical technique was developed for the analysis of electromagnetic scattering from a large, deep, and arbitrarily-shaped open cavity. This technique is based on the finite element method (FEM) that is known for its capability to handle arbitrary geometries and complex material composition. The FEM mesh at the cavity aperture is terminated in an exact manner by the boundary-integral (BI) method. We enhance the efficiency of the technique using special mixed-order prism elements that have a higher-order interpolation in the transverse plane and a lower-order interpolation in the longitudinal direction. The numerical results demonstrate that this type of elements is optimal for the proposed technique.
Keywords :
boundary integral equations; electromagnetic wave scattering; finite element analysis; interpolation; radar cross-sections; EM wave scattering; FEM mesh; RCS; boundary-integral method; cavity aperture; complex material composition; computational electromagnetics; deep open cavity; efficient numerical technique; electromagnetic wave scattering; higher-order finite element method; higher-order interpolation; large cavities; longitudinal direction; lower-order interpolation; mixed-order prism elements; optimal elements; plane wave scattering; radar cross section; transverse plane; Apertures; Composite materials; Computational electromagnetics; Electromagnetic analysis; Electromagnetic scattering; Finite element methods; Geometry; Interpolation; Radar cross section; Radar scattering;
Conference_Titel :
Antennas and Propagation Society International Symposium, 2000. IEEE
Conference_Location :
Salt Lake City, UT, USA
Print_ISBN :
0-7803-6369-8
DOI :
10.1109/APS.2000.875430