DocumentCode :
357836
Title :
Development of a closed-form expression for the input impedance of power-ground plane structures
Author :
Xu, Minjia ; Ji, Yun ; Hubing, Todd H. ; Van Doren, Thomas P. ; Drewniak, James L.
Author_Institution :
Dept. of Electr. & Comput. Eng., Missouri Univ., Rolla, MO, USA
Volume :
1
fYear :
2000
fDate :
2000
Firstpage :
77
Abstract :
This paper analyzes the fundamental behavior of PCB power bus structures using the modal expansion method. The results are validated by experiments and full-wave numerical modeling. It is shown that the power bus can be modeled as a series LeC circuit below the first board resonance frequency. C is the interplane capacitance and L e is an effective inductance contributed by all the cavity modes. The effects of the layer thickness, port location, board size and the feeding wire radius on the value of Le are discussed in this study. Le can be estimated from the geometry parameters of the test board. The goal is to obtain a simple model that can be used to analyze the power bus impedance below the first board resonance
Keywords :
circuit resonance; earthing; electric impedance; electromagnetic compatibility; electromagnetic interference; passive networks; power electronics; printed circuit design; wires (electric); EMC; EMI; PCB design; PCB power bus structures; board size; cavity modes; closed-form expression; effective inductance; experiments; feeding wire radius; first board resonance frequency; full-wave numerical modeling; geometry parameters; input impedance; interplane capacitance; layer thickness; modal expansion method; port location; power bus impedance; power-ground plane structures; series LC circuit; test board; Capacitance; Closed-form solution; Geometry; Impedance; Inductance; Numerical models; RLC circuits; Resonance; Resonant frequency; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2000. IEEE International Symposium on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5677-2
Type :
conf
DOI :
10.1109/ISEMC.2000.875541
Filename :
875541
Link To Document :
بازگشت