The study of substrate noise and noise-rejection-efficiency of guard-ring in monolithic integrated circuits

Author

Chen, Hwan-Mei ; Wu, Ming-Hwei ; Liau, B.C. ; Chang, Laurence ; Wu, Ching-Fu

Author_Institution

Dept. of Electron. Eng., Nat. Taiwan Inst. of Technol., Taipei, Taiwan

Volume

1

fYear

2000

fDate

2000

Firstpage

123

Abstract

This paper discusses the phenomenon of the interference, induced by the switching behavior of a device to other devices and how to reduce it in integrated circuits. We built up a simple model to study the characteristics of noise coupling through a common substrate. Also, we study many types of guard-ring and their efficiencies of noise-rejection. One NMOS is used as a switching device (noise-source), and another NMOS, biased in the linear region, to be the noise sensing device. The experimental results are consistent with the results from the HSPICE simulation using this model. The chip used for experimental verification is produced by TSMC (SPTM06 technology)

Keywords

MOS integrated circuits; SPICE; circuit simulation; integrated circuit noise; interference suppression; semiconductor switches; HSPICE simulation; NMOS; SPTM06 technology; TSMC; device switching behavior; experimental results; experimental verification; guard-ring; interference reduction; linear region bias; monolithic integrated circuits; noise coupling; noise rejection efficiency; noise sensing device; noise source; substrate noise; Analog circuits; Circuit noise; Coupling circuits; Crosstalk; Digital circuits; Integrated circuit noise; Integrated circuit technology; MOS devices; Noise figure; Noise reduction;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 2000. IEEE International Symposium on

Conference_Location

Washington, DC

Print_ISBN

0-7803-5677-2

Type

conf

DOI

10.1109/ISEMC.2000.875549

Filename

875549