Modeling the radiated emissions from microprocessors and other VLSI devices

This paper presents a heuristic model for describing radiated emissions from microprocessors by considering the emissions spectrum to be that of an excited, or driven, electron gas. The main idea is derived from a modification of the classical Maxwell-Boltzmann distribution of molecular velocities in an ideal gas. In this paper, that procedure is applied to the free electrons in a conducting surface, where the electrons are assumed to be in a gas state residing over the surface of the conductor. Using the conductor volume, and the excitation signal characteristics, a distribution is found that roughly corresponds to measured distributions found in microprocessors. The derived equation is applied for each event risetime, I/O switching and internal switching, and summed