• DocumentCode
    357860
  • Title

    Current and future EMI challenges at Intel and how to manage them

  • Author

    Havarasan, P. ; Haines, Mike ; Skinner, Harry ; Justice, Frank

  • Author_Institution
    Intel Corp., Hillsboro, OR, USA
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    281
  • Abstract
    Most EMI issues have been resolved using expensive enclosures and gaskets at the system level. In addition, simple components such as decoupling and filtering devices were added to the board to reduce power plane and I/O (input/output) port noise. These were acceptable methodologies in the past when clock frequencies were low (<33 MHz), and cost pressures were less `overbearing´. However, these approaches are not possible due to increasing frequencies (~ GHz) and power (~100 W) requirements. The traditional methods are not working since the chassis has limited shielding effectiveness above 1 GHz, and decoupling and filtering devices are ineffective at high frequencies. In addition, with the popularity of the value PC, it is undesirable to add cost to the system. This paper summarizes the historical problems and solutions encountered at Intel, and providing few approaches that have yielded great benefits in terms of solution and cost. In addition, future approaches for effective EMI management at the system, board, and component levels are discussed
  • Keywords
    earthing; electric noise measurement; electromagnetic interference; electromagnetic shielding; heat sinks; packaging; printed circuits; EMI challenges; EMI management; FCC; I/O port noise reduction; Intel; PCB; clock frequencies; decoupling devices; enclosures; filtering devices; gaskets; heatsink grounding; power plane noise reduction; shielding effectiveness; system level; Cables; Clocks; Connectors; Contacts; Costs; Electromagnetic interference; FCC; Filtering; Frequency; Gaskets;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2000. IEEE International Symposium on
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-7803-5677-2
  • Type

    conf

  • DOI
    10.1109/ISEMC.2000.875578
  • Filename
    875578