Title :
Analysis of PCB level EMI phenomena using an adaptive low-frequency plane wave time domain algorithm
Author :
Aygün, K. ; Lu, M. ; Shanker, B. ; Michielssen, E.
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
Abstract :
A novel integral equation based algorithm is proposed that permits the analysis of PCB-level EMI phenomena. The algorithm is based on the multilevel plane wave time domain algorithm (PWTD). For a problem of N T temporal and NS spatial unknowns involving no sub-wavelength features, the multilevel PWTD algorithm reduces the O(N TNS2) computational cost of a classical marching-on-in-time (MOT) algorithm to O(NTNSlog 2NS). However, PCB structures with fine geometrical details such as very thin slots, closely spaced vias or pins, etc., call for a highly non-uniform spatial discretization of the problem domain. In such cases, a straightforward implementation of the multilevel PWTD scheme cannot achieve a reduced computational complexity. Here, an adaptive low-frequency PWTD algorithm is described to solve this problem. Numerical results are presented to demonstrate the applicability of the scheme to the EMI analysis of complex PCB problems
Keywords :
adaptive systems; computational complexity; electromagnetic compatibility; electromagnetic interference; integral equations; printed circuits; time-domain analysis; 3D arbitrarily shaped PEC surfaces; CB problems; EMC; EMI analysis; PCB level EMI; adaptive LF plane wave time domain algorithm; adaptive low-frequency PWTD algorithm; closely spaced pins; closely spaced vias; computational complexity; computational cost reduction; electromagnetic compatibility; electromagnetic interference; fine geometrical details; full-wave analysis; integral equation based algorithm; marching-on-in-time algorithm; multilevel PWTD; multilevel plane wave time domain algorithm; nonuniform spatial discretization; very thin slots; wires; Algorithm design and analysis; Clocks; Computational complexity; Electromagnetic compatibility; Electromagnetic interference; Finite difference methods; Integral equations; Message-oriented middleware; Time domain analysis; Transient analysis;
Conference_Titel :
Electromagnetic Compatibility, 2000. IEEE International Symposium on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5677-2
DOI :
10.1109/ISEMC.2000.875581