Title :
Analog IC test and product engineering curriculum for M
Author :
Kamsani, N.A. ; Sidek, R.M. ; Yeo, C.W. ; Gan, D. ; Quek, C.T. ; Krishnasamy, S. ; Lee, Y.M. ; Bolanos, M.A.
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. Putra Malaysia, Serdang, Malaysia
Abstract :
Production test is a significant driver of semiconductor manufacturing cost. Parallel with the advances of semiconductor fabrication, the need for a pool of talented product and test engineers is significantly increasing. This paper describes the academia-industries collaboration effort in developing an analogue electronic test and product engineering to boost-up technical competencies of electronic engineering graduates particularly in microelectronic major. The program has been successfully conducted at Universiti Putra Malaysia with strong support from Texas Instruments and Teradyne.
Keywords :
analogue integrated circuits; electronic engineering education; integrated circuit manufacture; integrated circuit testing; production engineering; academia-industries collaboration effort; analog IC test; analogue electronic test; electronic engineering graduates; product engineering curriculum; production test; semiconductor fabrication; semiconductor manufacturing cost; Collaboration; Integrated circuits; Performance evaluation; Software; Testing; Training; Analogue Electronics; Engineering Education; Production Test;
Conference_Titel :
Teaching, Assessment and Learning (TALE), 2014 International Conference on
DOI :
10.1109/TALE.2014.7062641
