Title :
Design and analysis of transient-suppression-devices based on SPICE-simulation
Author :
Weber, Thomas ; Ter Haseborg, Jan Luiken
Author_Institution :
Dept. of Meas. Eng. & Electromagn. Compatibility, Univ. of Technol., Hamburg-Harburg, Germany
Abstract :
In order to meet the requirements of EMC directives and to obtain a high reliability of electronic systems, nonlinear protection circuits are necessary to suppress overvoltages and fast transients. Especially for RF-applications the designer has to match contrary criteria concerning the suppression of the transients and the influence on the transmitted information signal due to attenuation, reflection and nonlinear distortions. Therefore a systematic design approach for nonlinear protection circuits based on SPICE has been developed, which makes it possible to perform simulations both in the time- and frequency-domain and to determine the energy transferred to the load, that has to be protected. Furthermore evolutionary algorithms have been used to compute models for the precise simulation of the RF-characteristics (S-parameters) of the nonlinear protection circuit
Keywords :
S-parameters; SPICE; arresters; electromagnetic compatibility; equivalent circuits; evolutionary computation; frequency-domain analysis; overvoltage protection; time-domain analysis; transients; EMC directives; RF-characteristics; SPICE-simulation; attenuation; electronic systems; equivalent circuits; evolutionary algorithms; fast transients; frequency-domain; gas arrester; high reliability; nonlinear distortions; nonlinear protection circuit; nonlinear protection circuits; overvoltages suppression; reflection; time-domain; transient-suppression-devices; transmitted information signal; Attenuation; Circuit simulation; Computational modeling; Electromagnetic compatibility; Nonlinear distortion; Reflection; SPICE; Signal design; Surge protection; Transient analysis;
Conference_Titel :
Electromagnetic Compatibility, 2000. IEEE International Symposium on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5677-2
DOI :
10.1109/ISEMC.2000.875608