DocumentCode
357886
Title
Balanced and unbalanced PCB layer stack-up for controlling radiated emissions
Author
Moongilan, Dheena
Author_Institution
Lucent Technol. Bell Labs., Holmdel, NJ, USA
Volume
1
fYear
2000
fDate
2000
Firstpage
453
Abstract
Canceling mutually opposing fields of a closed circuit can control differential-mode current radiation. When the high frequency components of digital pulses fail to form a closed circuit, they often radiate or become common-mode noise. In spite of prudent EMC design, high frequency common-mode current is inadvertently produced, especially in large PCBs. This paper describes circumstances in which high frequency common-mode current production is difficult to control in the power and ground layers of PCBs. Methods to solve radiated emission problems using a combination stack-up consisting of balanced and unbalanced power and signal ground layers are explained. Both high and low frequency characteristics of PCB layer stack-up are reviewed and the effectiveness of interlayer inductance and capacitance in minimizing common-mode noise generation and radiation is analyzed. Radiated emissions measured on experimental PCB stack-ups for balanced and unbalanced power and signal ground layers are presented and the results discussed
Keywords
capacitance; inductance; interference suppression; printed circuits; radiofrequency interference; EMC design; balanced PCB layer stack-up; capacitance; closed circuit; combination stack-up; common-mode noise; differential-mode current radiation; digital pulses; high frequency common-mode current; high frequency components; interlayer inductance; mutually opposing fields; radiated emission problems; radiated emissions; signal ground layer; unbalanced PCB layer stack-up; Capacitance; Circuit noise; Electromagnetic compatibility; Frequency; Inductance; Low-frequency noise; Noise cancellation; Noise generators; Production; Pulse circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 2000. IEEE International Symposium on
Conference_Location
Washington, DC
Print_ISBN
0-7803-5677-2
Type
conf
DOI
10.1109/ISEMC.2000.875611
Filename
875611
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