Title :
Multi-label classification method based on extreme learning machines
Author :
Venkatesan, Rajasekar ; Meng Joo Er
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Inst., Singapore, Singapore
Abstract :
In this paper, an Extreme Learning Machine (ELM) based technique for Multi-label classification problems is proposed and discussed. In multi-label classification, each of the input data samples belongs to one or more than one class labels. The traditional binary and multi-class classification problems are the subset of the multi-label problem with the number of labels corresponding to each sample limited to one. The proposed ELM based multi-label classification technique is evaluated with six different benchmark multi-label datasets from different domains such as multimedia, text and biology. A detailed comparison of the results is made by comparing the proposed method with the results from nine state of the arts techniques for five different evaluation metrics. The nine methods are chosen from different categories of multi-label methods. The comparative results shows that the proposed Extreme Learning Machine based multi-label classification technique is a better alternative than the existing state of the art methods for multi-label problems.
Keywords :
learning (artificial intelligence); pattern classification; ELM based technique; binary classification problem; evaluation metrics; extreme learning machine; input data sample; multiclass classification problem; multilabel classification method; multilabel classification technique; multilabel dataset; multilabel problem; Accuracy; Classification algorithms; Decision trees; Machine learning algorithms; Measurement; Support vector machines; Training; Classification; Extreme Learning Machines; Machine Learning; Multi-label Learning;
Conference_Titel :
Control Automation Robotics & Vision (ICARCV), 2014 13th International Conference on
DOI :
10.1109/ICARCV.2014.7064375