DocumentCode :
358128
Title :
Modern testing technology for insulation system development of global VPIed large motors
Author :
Gao, George ; Steinhauser, Margaret ; Chen, William
Author_Institution :
R&D Center, TECO-Westinghouse Motor Co., Round Rock, TX, USA
Volume :
2
fYear :
2000
fDate :
2000
Firstpage :
961
Abstract :
This paper introduces some modern testing technology used to develop and improve the insulation systems of global vacuum and pressure impregnated high voltage large motors. With the market trend toward reduced frame sizes and more cost-competitive motors growing rapidly, there is increasing pressure to reduce insulation thickness. This in turn leads to the need for increased dielectric strength for the insulation system. In order to ensure the proper selection of new materials and processes, and to ensure the quality and reliability of newly developed insulation systems, an effective testing system must be developed. This system must be used to evaluate the prospective insulation systems. In the last few fears, extensive tests have been conducted by the TECO-Westinghouse Motor Company to develop a comprehensive and modern test system. This system has been used successfully to evaluate different new materials and systems and to set the quality criteria for motor manufacturing processes. In this paper, an overview of a modern testing system and some sample results is presented
Keywords :
AC motors; IEEE standards; electric strength; insulation testing; machine insulation; machine testing; IEEE 1310 testing; IEEE 275/429 testing; TECO-Westinghouse Motor Company; dielectric strength; endurance testing; formwound stator coils; global VPIed large motors; groundwall insulation; insulation system development; insulation system quality; insulation system reliability; insulation thickness reduction; reduced frame sizes; testing technology; vacuum pressure impregnated HV motors; Conducting materials; Dielectric breakdown; Dielectric materials; Dielectrics and electrical insulation; Insulation testing; Materials reliability; System testing; Vacuum systems; Vacuum technology; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Properties and Applications of Dielectric Materials, 2000. Proceedings of the 6th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
0-7803-5459-1
Type :
conf
DOI :
10.1109/ICPADM.2000.876390
Filename :
876390
Link To Document :
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