• DocumentCode
    3581569
  • Title

    Novel thermal management and its analysis in GaN electronics

  • Author

    Kuball, Martin ; Calvo, Julian Anaya ; Simon, Roland B. ; Pomeroy, James W.

  • Author_Institution
    Center for Device Thermography and Reliability (CDTR), University of Bristol, BS8 1TL, United Kingdom
  • fYear
    2014
  • Firstpage
    920
  • Lastpage
    922
  • Abstract
    GaN in microwave and power electronics enables performances of systems and their safe operating area to be driven to ´extremes´. When this challenge is taken up, thermal management is one of the major issues to be addressed. This includes heat transfer limitations across interfaces, however also the potential of incorporating novel materials such as diamond and also bulk GaN into GaN electronics to improve thermal management and device reliability. Thermal parameters of these novel device systems and their implications on the channel temperature in the devices are however at present often not well known. Our latest results in this field are presented.
  • Keywords
    Aluminum gallium nitride; Conductivity; Diamonds; Gallium nitride; HEMTs; Substrates; Thermal conductivity; GaN electronics; bulk GaN substrates; diamond; reliability; thermal management;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference (APMC), 2014 Asia-Pacific
  • Type

    conf

  • Filename
    7067578