DocumentCode :
3581742
Title :
Demonstration of on-wafer noise figure measurement of 300-GHz amplifier MMIC utilizing microwave photonic noise source
Author :
Song, Ho-jin ; Yaita, Makoto
Author_Institution :
NTT Device Technology Laboratories, Nippon Telegraph and Telephone Corporation, Japan
fYear :
2014
Firstpage :
435
Lastpage :
437
Abstract :
This paper presents an on-wafer noise figure measurement utilizing a microwave photonic noise source in the 300-GHz band, where a conventional noise diode source is not available. The microwave photonics noise source, consisting of a waveguide-packaged uni-travelling-carrier photodiode and an optical amplified-spontaneous-emission noise source, offers an excess noise ratio of 15 dB or more, even including the loss of the measurement setup. We describe the measurement procedure, including the calibration of the measurement setup, and present the on-wafer noise figure measurement of a 300-GHz cascode amplifier with a brief discussion of repeatability.
Keywords :
Decision support systems; Laboratories; Noise; Noise figure; Probes; Receivers; Standards; ASE noise; Microwave photonic noise source; Noise figure measurement; Terahertz-wave; UTC-PD; Y-factor measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference (APMC), 2014 Asia-Pacific
Type :
conf
Filename :
7067751
Link To Document :
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