• DocumentCode
    3581742
  • Title

    Demonstration of on-wafer noise figure measurement of 300-GHz amplifier MMIC utilizing microwave photonic noise source

  • Author

    Song, Ho-jin ; Yaita, Makoto

  • Author_Institution
    NTT Device Technology Laboratories, Nippon Telegraph and Telephone Corporation, Japan
  • fYear
    2014
  • Firstpage
    435
  • Lastpage
    437
  • Abstract
    This paper presents an on-wafer noise figure measurement utilizing a microwave photonic noise source in the 300-GHz band, where a conventional noise diode source is not available. The microwave photonics noise source, consisting of a waveguide-packaged uni-travelling-carrier photodiode and an optical amplified-spontaneous-emission noise source, offers an excess noise ratio of 15 dB or more, even including the loss of the measurement setup. We describe the measurement procedure, including the calibration of the measurement setup, and present the on-wafer noise figure measurement of a 300-GHz cascode amplifier with a brief discussion of repeatability.
  • Keywords
    Decision support systems; Laboratories; Noise; Noise figure; Probes; Receivers; Standards; ASE noise; Microwave photonic noise source; Noise figure measurement; Terahertz-wave; UTC-PD; Y-factor measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference (APMC), 2014 Asia-Pacific
  • Type

    conf

  • Filename
    7067751