• DocumentCode
    3581816
  • Title

    Discussions on measurement accuracy of complex relative permittivity using a balanced-type circular disk resonator method

  • Author

    Nakatsutsumi, Jun ; Kobayashi, Yoshio ; Ma, Zhe-Wang

  • Author_Institution
    Saitama University, 338-8570, Japan
  • fYear
    2014
  • Firstpage
    522
  • Lastpage
    524
  • Abstract
    A balanced-type circular disk resonator method is used to measure complex relative permittivity in the normal direction of dielectric substrates. In this paper, at first, a technique is proposed to take copper disk thickness into account to realize more accurate measurement. Secondly, a cyclo-olefin polymer (COP) substrate is measured by using four circular copper disks with different diameters to verify reasonability of the proposed technique. Finally, influence of the air-gap between substrates is discussed.
  • Keywords
    Conductors; Copper; Fixtures; Permittivity; Permittivity measurement; Substrates; complex relative permittivity; dielectric substrates; influence of fringing field; microwave measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference (APMC), 2014 Asia-Pacific
  • Type

    conf

  • Filename
    7067825