DocumentCode :
3581816
Title :
Discussions on measurement accuracy of complex relative permittivity using a balanced-type circular disk resonator method
Author :
Nakatsutsumi, Jun ; Kobayashi, Yoshio ; Ma, Zhe-Wang
Author_Institution :
Saitama University, 338-8570, Japan
fYear :
2014
Firstpage :
522
Lastpage :
524
Abstract :
A balanced-type circular disk resonator method is used to measure complex relative permittivity in the normal direction of dielectric substrates. In this paper, at first, a technique is proposed to take copper disk thickness into account to realize more accurate measurement. Secondly, a cyclo-olefin polymer (COP) substrate is measured by using four circular copper disks with different diameters to verify reasonability of the proposed technique. Finally, influence of the air-gap between substrates is discussed.
Keywords :
Conductors; Copper; Fixtures; Permittivity; Permittivity measurement; Substrates; complex relative permittivity; dielectric substrates; influence of fringing field; microwave measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference (APMC), 2014 Asia-Pacific
Type :
conf
Filename :
7067825
Link To Document :
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