DocumentCode
3581863
Title
Development of RF attenuation measurement standard using VNA
Author
Perangin-angin, Windi Kurnia ; Widarta, Anton
Author_Institution
Research Center of Metrology, Puslit Metrologi LIPI, Indonesia
fYear
2014
Firstpage
898
Lastpage
900
Abstract
Development of RF attenuation standard using a commercial VNA is presented. Linearity of the VNA is measured and evaluated in detail for determining attenuation measurement ability and accuracy. An effective procedure to ensure the traceability to the attenuation primary standard is demonstrated by simply performing calibration on a single frequency. The nonlinearity of 0.001 dB for measurements up to 20 dB, 0.01 dB for 40 dB and 0.03 dB for 60 dB at 100 MHz, 1 GHz and 3 GHz are obtained.
Keywords
Abstracts; Attenuation; Attenuation measurement; Metrology; Silicon; Standards; Attenuation; RF; VNA; linearity; standard;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference (APMC), 2014 Asia-Pacific
Type
conf
Filename
7067872
Link To Document