• DocumentCode
    3581863
  • Title

    Development of RF attenuation measurement standard using VNA

  • Author

    Perangin-angin, Windi Kurnia ; Widarta, Anton

  • Author_Institution
    Research Center of Metrology, Puslit Metrologi LIPI, Indonesia
  • fYear
    2014
  • Firstpage
    898
  • Lastpage
    900
  • Abstract
    Development of RF attenuation standard using a commercial VNA is presented. Linearity of the VNA is measured and evaluated in detail for determining attenuation measurement ability and accuracy. An effective procedure to ensure the traceability to the attenuation primary standard is demonstrated by simply performing calibration on a single frequency. The nonlinearity of 0.001 dB for measurements up to 20 dB, 0.01 dB for 40 dB and 0.03 dB for 60 dB at 100 MHz, 1 GHz and 3 GHz are obtained.
  • Keywords
    Abstracts; Attenuation; Attenuation measurement; Metrology; Silicon; Standards; Attenuation; RF; VNA; linearity; standard;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference (APMC), 2014 Asia-Pacific
  • Type

    conf

  • Filename
    7067872