Title :
Low-leakage 9-CN-MOSFET SRAM cell with enhanced read and write voltage margins
Author :
Yanan Sun ; Hailong Jiao ; Kursun, Volkan
Author_Institution :
Hong Kong Univ. of Sci. & Technol., Kowloon, China
Abstract :
A novel static random-access memory (SRAM) cell with nine carbon nanotube MOSFETs (9-CN-MOSFETs) is proposed in this paper. With the new 9-CN-MOSFET SRAM cell, the read data stability is enhanced by 99.09% while providing similar read speed as compared to the conventional six-transistor (6T) SRAM cell in a 16nm carbon nanotube transistor technology. The worst-case write voltage margin is increased by 4.57x with the proposed 9-CN-MOSFET SRAM cell as compared to the conventional 6T SRAM cell. Furthermore, a 1Kibit SRAM array with the new memory cells consumes 34.18% lower leakage power as compared to the memory array with 6T SRAM cells in idle mode.
Keywords :
MOSFET circuits; SRAM chips; carbon nanotube field effect transistors; 6T SRAM cell; carbon nanotube transistor technology; enhanced read-write voltage margins; low-leakage 9-CN-MOSFET SRAM cell; nine carbon nanotube MOSFETs; read data stability; six-transistor SRAM cell; size 16 nm; static random-access memory cell; storage capacity 1 Kbit; Arrays; Carbon nanotubes; Delays; Power demand; SRAM cells; Transistors;
Conference_Titel :
Microelectronics (ICM), 2014 26th International Conference on
DOI :
10.1109/ICM.2014.7071832