Series resistances impacts on full-printed organic circuits

Impacts of the series resistances scattering in fullprinted organic circuits manufacturing process is studied in this work. The modeling was done by using the well-known Amorphous-Silicon Hydrogenated Thin Film Transistor (A-Si: H TFT) model initially planned for Amorphous Thin Film Transistors. Extractions methods dedicated to this model were applied to organic thin film transistors (OTFTs) using an automatic procedure. This extraction procedure including all above-threshold parameters was applied to a sample of N-type and P-type organic transistors. It then appeared a non-negligible process dispersion correlated and fitted with ideal statistic model. Afterwards, these statistic models are integrated to model cards in order to achieve Monte-Carlo simulations, thus permitting to evaluate the impact of series resistances on full-printed organic circuits. An organic inverter was chosen as example to do the study.