DocumentCode :
3583377
Title :
Analysis of coherent optical transition radiation interference patterns produced by SASE-induced microbunches
Author :
Rule, D.W. ; Lumpkin, A.H.
Author_Institution :
Carderock Div., Naval Surface Warfare Center, West Bethesda, MD, USA
Volume :
2
fYear :
2001
fDate :
6/23/1905 12:00:00 AM
Firstpage :
1288
Abstract :
We present an analysis of data published recently on coherent optical transition radiation interferometry (COTRI) angular distributions made on the Argonne experiment on microbunching. These COTRI distributions exhibited some intriguing characteristics: highly enhanced lobe patterns in the ±θy direction, instead of circularly symmetric fringes; and asymmetries in intensities in +θy vs. -θy in some cases. We have done calculations that produce patterns consistent with those observed. The role of the microbunch´s elliptical transverse beam profile in accounting for the θxy asymmetry is illustrated. Similarly, a beam profile with a ±y asymmetry gives a lobe asymmetry in +θy vs. -θ y. The interplay of the interference fringe pattern and the microbunch´s transverse form factor accounts for the angular positions of the lobes. The fringe visibility was calculated by convolving the beam divergence distribution with the COTRI pattern. Thus, we have shown that COTRI angular patterns can be used to characterize the effective transverse size, microbunch length, divergence, and the bunching fraction
Keywords :
electron beams; particle beam bunching; superradiance; transition radiation; COTRI angular patterns; SASE-induced microbunches; bunching fraction; circularly symmetric fringes; coherent optical transition radiation interference patterns; coherent optical transition radiation interferometry angular distributions; elliptical transverse beam profile; fringe visibility; highly enhanced lobe patterns; interference fringe pattern; lobe asymmetry; microbunch divergence; microbunch length; microbunching; transverse form factor; Data analysis; Electron optics; Fourier transforms; Interference; Microwave integrated circuits; Optical interferometry; Pattern analysis; Spontaneous emission; Stimulated emission; Undulators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Particle Accelerator Conference, 2001. PAC 2001. Proceedings of the 2001
Print_ISBN :
0-7803-7191-7
Type :
conf
DOI :
10.1109/PAC.2001.986656
Filename :
986656
Link To Document :
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