DocumentCode
3583377
Title
Analysis of coherent optical transition radiation interference patterns produced by SASE-induced microbunches
Author
Rule, D.W. ; Lumpkin, A.H.
Author_Institution
Carderock Div., Naval Surface Warfare Center, West Bethesda, MD, USA
Volume
2
fYear
2001
fDate
6/23/1905 12:00:00 AM
Firstpage
1288
Abstract
We present an analysis of data published recently on coherent optical transition radiation interferometry (COTRI) angular distributions made on the Argonne experiment on microbunching. These COTRI distributions exhibited some intriguing characteristics: highly enhanced lobe patterns in the ±θy direction, instead of circularly symmetric fringes; and asymmetries in intensities in +θy vs. -θy in some cases. We have done calculations that produce patterns consistent with those observed. The role of the microbunch´s elliptical transverse beam profile in accounting for the θx-θy asymmetry is illustrated. Similarly, a beam profile with a ±y asymmetry gives a lobe asymmetry in +θy vs. -θ y. The interplay of the interference fringe pattern and the microbunch´s transverse form factor accounts for the angular positions of the lobes. The fringe visibility was calculated by convolving the beam divergence distribution with the COTRI pattern. Thus, we have shown that COTRI angular patterns can be used to characterize the effective transverse size, microbunch length, divergence, and the bunching fraction
Keywords
electron beams; particle beam bunching; superradiance; transition radiation; COTRI angular patterns; SASE-induced microbunches; bunching fraction; circularly symmetric fringes; coherent optical transition radiation interference patterns; coherent optical transition radiation interferometry angular distributions; elliptical transverse beam profile; fringe visibility; highly enhanced lobe patterns; interference fringe pattern; lobe asymmetry; microbunch divergence; microbunch length; microbunching; transverse form factor; Data analysis; Electron optics; Fourier transforms; Interference; Microwave integrated circuits; Optical interferometry; Pattern analysis; Spontaneous emission; Stimulated emission; Undulators;
fLanguage
English
Publisher
ieee
Conference_Titel
Particle Accelerator Conference, 2001. PAC 2001. Proceedings of the 2001
Print_ISBN
0-7803-7191-7
Type
conf
DOI
10.1109/PAC.2001.986656
Filename
986656
Link To Document