Title :
Investigation of the surface resistivity tolerance of the kicker ceramic vacuum chamber at APS
Author :
Doose, C. ; Emery, L. ; Kim, S.H.
Author_Institution :
Adv. Photon Source, Argonne Nat. Lab., IL, USA
fDate :
6/23/1905 12:00:00 AM
Abstract :
The conductive coating on the kicker ceramic vacuum chambers was found to affect the pulse width, amplitude, and phase of the kicker magnetic field. Differences in the surface resistivity between the chambers caused each kicker magnetic field to have a slightly different pulse shape, resulting in unwanted betatron oscillations of the stored beam during injection into the storage ring at the Advanced Photon Source. Orbit oscillations were measured with the present kicker mismatch and optimized for a closed bump. Tracking simulations of the closed bump provided an idealized tolerance for the variation of chamber surface resistivity consistent with minimizing the betatron oscillations. The pulse shape of the ticker current Was dependent on the current level and the coupling between the kicker magnet and chamber. Local magnetic fields in two prototype kicker chambers were measured and compared with eddy current calculations
Keywords :
accelerator magnets; ceramics; coatings; eddy current testing; electrical resistivity; electromagnets; electron accelerators; electron beams; particle beam injection; particle beam stability; storage rings; surface phenomena; APS; Advanced Photon Source; amplitude; beam injection; betatron oscillations; closed bump; conductive coating; eddy current calculations; kicker ceramic vacuum chambers; kicker magnetic field; kicker mismatch; orbit oscillations; phase; pulse width; storage ring; stored beam; surface resistivity tolerance; tracking simulations; Ceramics; Coatings; Conductivity; Couplings; Extraterrestrial measurements; Magnetic field measurement; Pulse shaping methods; Shape; Space vector pulse width modulation; Storage rings;
Conference_Titel :
Particle Accelerator Conference, 2001. PAC 2001. Proceedings of the 2001
Print_ISBN :
0-7803-7191-7
DOI :
10.1109/PAC.2001.986724