• DocumentCode
    3583964
  • Title

    Genetic Algorithm and Machine Learning Based Void Fraction Measurement of Two-Phase Flow

  • Author

    Wang Weiwei ; Zhu Xiaoqian ; Wang Ping ; Fan Shangchun ; Ren Dongshun

  • Author_Institution
    Sch. of Inf. & Control Eng., China Univ. of Pet., Dongying, China
  • Volume
    2
  • fYear
    2010
  • Firstpage
    355
  • Lastpage
    358
  • Abstract
    Machine learning and Genetic Algorithm based void fraction measurement method is provided in this paper. Because there are some relationships between the void fraction and the differential pressure (DP) signal acquired near the pipe wall when the two phases are flowing along the pipeline, it is possible to measure the void fraction according to the DP signal. However, the expression between the void fraction and the DP signal is complicated and is not easy to be developed because of the complexity of the characteristics of two-phase flow. In this paper, SVM is adopted to investigate the relationship between the void fraction and the DP signal. GA is used to estimate the parameters involved in SVM. The experimental results show that machine learning and genetic algorithm based void fraction measurement method provided in this paper is available.
  • Keywords
    computational fluid dynamics; flow measurement; genetic algorithms; learning (artificial intelligence); parameter estimation; pipe flow; support vector machines; two-phase flow; SVM; differential pressure signal; genetic algorithm; machine learning; parameter estimation; pipeline; support vector machines; two-phase flow; void fraction measurement; Fluctuations; Fluid flow measurement; Genetic algorithms; Instruments; Machine learning; Phase measurement; Pipelines; Risk management; Support vector machines; Volume measurement; Genetic Algorithm; Machine Learning; SVM; Two-Phase Flow; Void Fraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Measuring Technology and Mechatronics Automation (ICMTMA), 2010 International Conference on
  • Print_ISBN
    978-1-4244-5001-5
  • Electronic_ISBN
    978-1-4244-5739-7
  • Type

    conf

  • DOI
    10.1109/ICMTMA.2010.760
  • Filename
    5459702