DocumentCode :
3584372
Title :
Design of a beam size monitor using Fresnel zone plates
Author :
Nakamura, N. ; Kamiya, Y. ; Koseki, T. ; Takaki, H. ; Aoki, N. ; Nakayama, K.
Author_Institution :
Inst. for Solid State Phys., Univ. of Tokyo, Chiba, Japan
Volume :
2
fYear :
2001
fDate :
6/23/1905 12:00:00 AM
Firstpage :
1628
Abstract :
Measuring electron-beam sizes is very important to estimate horizontal and vertical emittances in low-emittance rings. The beam size monitor using Fresnel zone plates (FZPs) has been designed for the Super-SOR ring (a new name of the VSX ring), which is a third-generation synchrotron light source being planned by the University of Tokyo. The monitor system has a structure of a long-distance X-ray microscope using two FZPs and has an advantage of direct and real-time monitoring of the electron beam profile. The synchrotron radiation from the electron beam at a bending magnet is monochromatized by a double-crystal monochromator and the electron beam profile is magnified and imaged on an X-ray CCD camera by two FZPs. The spatial resolution is estimated to be about 1 μm for the photon energy of 5 keV and it is sufficiently high to measure the horizontal and vertical beam sizes, 14 μm and 3.6 μm at minimum, respectively. The design of the new beam profile monitor using Fresnel zone plates is presented in this paper
Keywords :
X-ray monochromators; X-ray optics; X-ray production; accelerator magnets; beam handling equipment; electromagnets; electron accelerators; electron beams; particle beam bunching; particle beam diagnostics; storage rings; 14 micron; 3.6 micron; 5 keV; FZP; Fresnel zone plates; Super-SOR ring; VSX ring; X-ray CCD camera; beam size monitor; bending magnet; double-crystal monochromator; electron beam profile; electron-beam size; horizontal emittances; long-distance X-ray microscope; low-emittance rings; photon energy; spatial resolution; synchrotron radiation; third-generation synchrotron light source; vertical emittances; Charge coupled devices; Electron beams; Electron microscopy; Fresnel reflection; Light sources; Monitoring; Real time systems; Size measurement; Synchrotron radiation; X-ray imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Particle Accelerator Conference, 2001. PAC 2001. Proceedings of the 2001
Print_ISBN :
0-7803-7191-7
Type :
conf
DOI :
10.1109/PAC.2001.986770
Filename :
986770
Link To Document :
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