DocumentCode
3584587
Title
Optimization of test signals for analog circuits
Author
Guliashki, V. ; Burdiek, B. ; Mathis, W.
Author_Institution
Inst. of Inf. Technol., Bulgarian Acad. of Sci., Sofia, Bulgaria
Volume
1
fYear
2003
Firstpage
133
Abstract
In this paper the optimization of test signals for integrated analog circuits by means of a genetic algorithm is considered. The test signal generation problem is formulated as an optimization problem, where through minimization of specific objective function a fault detection criterion for the tested circuit is maximized. The simulation results show that the use of optimized test signals leads to considerable increasing of the detected faults number.
Keywords
analogue integrated circuits; optimisation; testing; fault detection criterion; genetic algorithm; integrated analog circuit; objective function; optimization; signal generation; signal test; tested circuit; Analog circuits; Artificial intelligence; Circuit faults; Circuit simulation; Circuit testing; Concrete; Electrical fault detection; Fault detection; Genetic algorithms; Space vector pulse width modulation;
fLanguage
English
Publisher
ieee
Conference_Titel
Telecommunications in Modern Satellite, Cable and Broadcasting Service, 2003. TELSIKS 2003. 6th International Conference on
Print_ISBN
0-7803-7963-2
Type
conf
DOI
10.1109/TELSKS.2003.1246200
Filename
1246200
Link To Document