Title :
Paired semi-blind channel identification for wideband CDMA communications
Author :
Li, Thomas Hong ; Zoltowski, Michael D.
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Abstract :
Semi-blind channel identification methods have successfully been applied to 3G W-CDMA communication systems. However, the computational complexity is relatively high because channel coefficients are estimated in high dimensional space. In this paper, a paired semi-blind channel identification method is proposed to reduce the computational complexity dramatically while maintaining the original performance. First, an equivalent SIMO channel model is derived for the de-spread signals through employing a dual-antenna receiver. Second, a paired semi-blind channel identification scheme is obtained by applying both the cross-relation method and pilot symbols to each pair of channel coefficients with the same multipath delay across two antennas. This allows one to estimate the channel coefficients in 2-dimensional space. Finally, simulations are performed to evaluate the paired semi-blind channel identification method´s applicability to 3G W-CDMA communication systems
Keywords :
broadband networks; code division multiple access; computational complexity; delays; identification; land mobile radio; multipath channels; multiuser channels; radio networks; receiving antennas; spread spectrum communication; 3G W-CDMA communication systems; SIMO channel model; channel coefficients; computational complexity; cross-relation method; de-spread signals; dual-antenna receiver; high dimensional space; mobile communication systems; multipath delay; paired semi-blind channel identification; performance; pilot symbols; simulations; wideband CDMA communications; Channel estimation; Communication standards; Communications technology; Computational complexity; Delay; Multiaccess communication; Performance evaluation; Quadrature phase shift keying; Space technology; Wideband;
Conference_Titel :
Spread Spectrum Techniques and Applications, 2000 IEEE Sixth International Symposium on
Conference_Location :
Parsippany, NJ
Print_ISBN :
0-7803-6560-7
DOI :
10.1109/ISSSTA.2000.878133