DocumentCode :
358531
Title :
Efficient design error correction of digital circuits
Author :
Hoffmann, Dirk W. ; Kropf, Thomas
Author_Institution :
Inst. of Comput. Eng., Tubingen Univ., Germany
fYear :
2000
fDate :
2000
Firstpage :
465
Lastpage :
472
Abstract :
Equivalence checking of two circuits is performed at several stages in the design cycle of hardware designs and various commercial equivalence checkers, mostly based on Boolean logic, are already in the market. Design Error Diagnosis and Correction (DEDC) methods come into play when equivalence checking has proven two circuits to be different. In many cases, DEDC methods can locate and correct design errors fully automatically. In this paper, we present an efficient symbolic method for automatic error correction of both combinational and synchronous sequential circuits. We first address the problem of rectifying combinational circuits and then show how the problem of rectifying sequential circuits can be reduced to a combinational problem without unrolling the combinational logic parts. In addition, we introduce several optimizations to our algorithm. All optimizations are safe, meaning that they neither affect the number of computed solutions nor do they neither affect the number of computed solutions nor do they decrease the quality of results. Our experimental results show that the discussed optimization strategies can make the rectification procedure 2 to 16 times faster than the unoptimized algorithm
Keywords :
combinational circuits; logic testing; sequential circuits; Design Error Diagnosis and Correction; automatic error correction; combinational; combinational logic; digital circuits; equivalence checking; error correction; sequential circuits; symbolic method; Automatic test pattern generation; Boolean functions; Circuit synthesis; Circuit testing; Combinational circuits; Computer errors; Design optimization; Digital circuits; Error correction; Sequential circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Design, 2000. Proceedings. 2000 International Conference on
Conference_Location :
Austin, TX
ISSN :
1063-6404
Print_ISBN :
0-7695-0801-4
Type :
conf
DOI :
10.1109/ICCD.2000.878324
Filename :
878324
Link To Document :
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