Title :
Face recognition via adaptive sparse representations of random patches
Author :
Mery, Domingo ; Bowyer, Kevin
Author_Institution :
Dept. of Comput. Sci., Pontificia Univ. Catolica de Chile, Santiago, Chile
Abstract :
Unconstrained face recognition is still an open problem, as state-of-the-art algorithms have not yet reached high recognition performance in real-world environments (e.g., crowd scenes at the Boston Marathon). This paper addresses this problem by proposing a new approach called Adaptive Sparse Representation of Random Patches (ASR+). In the learning stage, for each enrolled subject, a number of random patches are extracted from the subject´s gallery images in order to construct representative dictionaries. In the testing stage, random test patches of the query image are extracted, and for each test patch a dictionary is built concatenating the `best´ representative dictionary of each subject. Using this adapted dictionary, each test patch is classified following the Sparse Representation Classification (SRC) methodology. Finally, the query image is classified by patch voting. Thus, our approach is able to deal with a larger degree of variability in ambient lighting, pose, expression, occlusion, face size and distance from the camera. Experiments were carried out on five widely-used face databases. Results show that ASR+ deals well with unconstrained conditions, outperforming various representative methods in the literature in many complex scenarios.
Keywords :
face recognition; feature extraction; image classification; image representation; image retrieval; learning (artificial intelligence); pose estimation; random processes; ASR+ approach; Boston Marathon; SRC methodology; adapted dictionary; adaptive sparse representation-of-random patches; adaptive sparse representations; ambient lighting; camera distance; complex scenarios; crowd scenes; face databases; face expression; face size; gallery images; image occlusion; learning stage; patch voting; pose eatimation; query image classification; random test patch extraction; representative dictionary concatenation; representative dictionary construction; sparse representation classification methodology; test patch classification; testing stage; unconstrained conditions; unconstrained face recognition; variability degree; Databases; Dictionaries; Face; Face recognition; Lighting; Testing; Training;
Conference_Titel :
Information Forensics and Security (WIFS), 2014 IEEE International Workshop on
DOI :
10.1109/WIFS.2014.7084296