The effects of space radiation on linear integrated circuits

Author

Johnston, Allan H. ; Guertin, Steven M.

Author_Institution

Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA

Volume

5

fYear

2000

fDate

2000

Firstpage

363

Abstract

Permanent and transient effects are discussed that are induced in linear integrated circuits by space radiation. Recent developments include enhanced damage at low dose rate, increased damage from protons due to displacement effects, and transients in digital comparators that can cause circuit malfunctions. Methods of selecting and testing devices for space applications are discussed, along with examples of radiation effects in fielded space systems

Keywords

bipolar analogue integrated circuits; comparators (circuits); proton effects; radiation hardening (electronics); space vehicle electronics; transients; HI effects; bipolar devices; device selection; device testing; digital comparator transients; displacement effects; enhanced damage; fielded space systems; ionization damage; linear integrated circuits; low dose rate; malfunctions; permanent effects; proton induced damage; space radiation effects; transient effects; Analog integrated circuits; CMOS technology; Circuit testing; Electron traps; Integrated circuit technology; Ionization; Ionizing radiation; Laboratories; Protons; Space technology;

fLanguage

English

Publisher

ieee

Conference_Titel

Aerospace Conference Proceedings, 2000 IEEE

Conference_Location

Big Sky, MT

ISSN

1095-323X

Print_ISBN

0-7803-5846-5

Type

conf

DOI

10.1109/AERO.2000.878509

Filename

878509