DocumentCode :
3586222
Title :
Mutation Based Feature Localization
Author :
Malburg, Jan ; Encrenaz-Tiphene, Emmanuelle ; Fey, Gorschwin
Author_Institution :
Inst. of Comput. Sci., Univ. of Bremen, Bremen, Germany
fYear :
2014
Firstpage :
49
Lastpage :
54
Abstract :
The complexity of modern chip designs is rapidly increasing. More and more blocks from old designs are reused and third party IP is licensed to fulfill strict time-to-market constraints. Often, poor documentation of such blocks makes improvements and extensions of the blocks a difficult time consuming task. In this paper we present a technique for automatically localizing the parts of the code which are relevant for a feature. With this a developer can better understand the design and, consequently, can adjust the design more efficiently. The presented approach uses mutants changing the code of the design at a certain location. The code changed by a mutant is considered to be related to a feature if the mutant is killed while the feature is used. The use cases are generated using an automatic approach. This approach is based on a description specifying how the different features are used. Compared to two previous approaches the manual work is significantly reduced and the localization is of similar or even better quality.
Keywords :
program testing; code mutants; code parts automatic localization; mutation testing; Automata; Computer architecture; Documentation; Feature extraction; Manuals; Optimization; Testing; HDL; Mutation testing; analysis; design understanding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocessor Test and Verification Workshop (MTV), 2014 15th International
ISSN :
1550-4093
Type :
conf
DOI :
10.1109/MTV.2014.14
Filename :
7087233
Link To Document :
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