Title :
Directed Test Case Generation for x86 Instruction Decoding
Author :
Seidel, Peter-Michael
Author_Institution :
Dept. of Inf. & Comput. Sci., Univ. of Hawai´i at Manoa, Honolulu, HI, USA
Abstract :
The x86 instruction set has historically grown to have a very complex definition. Simply enumerating a representative for every type of instruction can already be challenging, but does not consider the allowed redundancies in instruction encoding, the variation of operand, addressing and constant choices and the generation of illegal instruction words. We are proposing a framework for directly targeting a broader set of instruction word choices in a controlled way based on a formal model of the x86 instruction encoding. This can be used for directed test case generation for the decoding of x86 instructions.
Keywords :
decoding; encoding; formal specification; instruction sets; program testing; directed test case generation; formal model; illegal instruction words; instruction word choices; operand variation; x86 instruction decoding; x86 instruction encoding; x86 instruction set; Computational modeling; Computer architecture; Decoding; Encoding; Law; Manuals; Test case generation; x86 instruction decoding;
Conference_Titel :
Microprocessor Test and Verification Workshop (MTV), 2014 15th International
DOI :
10.1109/MTV.2014.30