Title :
Chaotic oscillation-based BIST for CMOS operational amplifier
Author :
Wannaboon, Chatchai ; Jiteurtragool, Nattagit ; Masayoshi, Tachibana
Author_Institution :
Kochi Univ. of Technol., Kami, Japan
Abstract :
This paper presents chaotic oscillation-based built-in self-test (BIST) for CMOS operational amplifier. The proposed BIST technique is based on the use of designed operational amplifier (op-amp) in the unity gain buffer of discrete time chaotic oscillator as circuit under test (CUT) of BIST. The presented BIST detected faults by using a differentiation of chaotic output signal among fault free and faulty CUT. The circuit is simulated in 0.18μm CMOS technology. The simulation results on circuit-level are presented to examine the feasibility and efficiency to detecting faults in op-amp.
Keywords :
CMOS integrated circuits; buffer circuits; built-in self test; operational amplifiers; oscillators; BIST; CMOS operational amplifier; CUT; built-in self-test; circuit under test; discrete time chaotic oscillator; size 0.18 mum; unity gain buffer; CMOS integrated circuits; Circuit faults; Logic gates; MOSFET; Nonlinear circuits; Switches; Very large scale integration; analog BIST; chaotic oscillator; oscillation-based test;
Conference_Titel :
SoC Design Conference (ISOCC), 2014 International
DOI :
10.1109/ISOCC.2014.7087607
