Title :
Fast allocation of post-silicon tunable buffers to mitigate timing variation
Author :
Hyungjung Seo ; Jeongwoo Heo ; Taewhan Kim
Author_Institution :
Sch. of Electr. & Comput. Eng., Seoul Nat. Univ., Seoul, South Korea
Abstract :
It is widely accepted that post-silicon tunable (PST) buffer, which can adjust its delay after manufacturing, is an effective design element that can mitigate the timing variation in circuits. However, since the size of PST buffer is not that small, it is very important to minimize the number of PST buffers to be allocated while meeting the timing yield constraint. Recently, two noticeable progresses have been made in the literature: (1) one is devising a formulation of `timing criticality´ which facilitates identifying a set of circuit paths that are more likely to be susceptible to the timing variation; (2) the other is developing a graph based timing representation which enables a fast timing yield computation. In this work, we exploit the two features of (1) and (2) on the PST buffer allocation. Namely, we extract timing critical paths according to (1), rather than relying on a simple rule of thumb, and iteratively allocate PST buffers to resolve the timing criticality based on the fast timing yield computation according to (2), instead of using a very slow Monte-Carlo simulation. Through experiments with benchmark circuits, it is shown that our proposed PST buffer allocation methodology speeds up the PST allocation by 10x~10000x over a Monte-Carlo simulation based approach. Furthermore, when compared with that produced by a full PST buffer allocation, ours is able to use 89.5% less number of PST buffers on average.
Keywords :
Monte Carlo methods; buffer circuits; elemental semiconductors; integrated circuit yield; silicon; timing circuits; Monte-Carlo simulation; PST buffer allocation; Si; benchmark circuits; graph based timing representation; post-silicon tunable buffers; timing critical paths; timing criticality; timing variation mitigation; timing yield constraint; Design automation; Monte Carlo methods; Post-silicon tunable (PST) buffer; allocation algorithm; statistical static timing analysis; timing variation; yield;
Conference_Titel :
SoC Design Conference (ISOCC), 2014 International
DOI :
10.1109/ISOCC.2014.7087660