Radiation pattern characterisation setup for G-band planar Yagi antennas

On-wafer radiation pattern characterisation test structure for G-band planar Yagi antennas is presented in this paper. It employs a number of identical planar Yagi antennas (one as a receiver and surrounded by multi transmitters) fabricated on the same substrate. On-wafer measurements are done using a Vector Network Analyser (VNA) to measure the radiation intensity at the different receiver-transmitter antenna configurations. Measured and simulated radiation patterns are in a good agreement. The designed planar Yagi antenna shows very wide bandwidth (S11< -10 dB) over the whole Gband. Higher front-to-back ratio could be obtained through optimised reflector geometry.