• DocumentCode
    358872
  • Title

    Analysis and control of monolithic piezoelectric nano-actuator

  • Author

    Chang, Timothy N. ; Sun, Xuemei ; Ji, Zhiming ; Caudill, Reggie

  • Author_Institution
    New Jersey Inst. of Technol., Newark, NJ, USA
  • Volume
    5
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    3086
  • Abstract
    This paper describes the analysis and control of a 2-DOF monolithic piezoelectric actuator. This actuator is part of a 6-DOF manipulator capable of linear resolution to 2 nanometer and angular resolution to 1 arc-second. Design of this actuator differs from the existing ones in that it has a monolithic structure which enables a high bandwidth, low drift, and high force realization. A number of nonlinearities exist in the actuator, stemming from the geometry and materials properties. For example, coupling of the actuator elements can be modeled as a soft spring which increases scale factor at high actuation levels. In this work, a combination of feedforward (amplitude-dependent input shaping) and feedback control are applied to reduce the effects of 1) scale factor nonlinearities, 2) hysteresis, and 3) output oscillations. Application of this actuator include: optoelectronics assembly, optical fiber alignment, and semiconductor processing
  • Keywords
    control nonlinearities; feedback; feedforward; nanotechnology; piezoelectric actuators; 2-DOF monolithic piezoelectric actuator; 6-DOF manipulator; amplitude-dependent input shaping control; feedback control; feedforward control; hysteresis; monolithic piezoelectric nano-actuator analysis; monolithic piezoelectric nano-actuator control; nonlinearities; optical fiber alignment; optoelectronics assembly; output oscillations; scale factor nonlinearities; semiconductor processing; Assembly; Bandwidth; Feedback control; Geometry; Hydraulic actuators; Hysteresis; Material properties; Piezoelectric actuators; Semiconductor process modeling; Springs;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference, 2000. Proceedings of the 2000
  • Conference_Location
    Chicago, IL
  • ISSN
    0743-1619
  • Print_ISBN
    0-7803-5519-9
  • Type

    conf

  • DOI
    10.1109/ACC.2000.879133
  • Filename
    879133