• DocumentCode
    3588991
  • Title

    Artificial neural network modeling for Extrinsic capacitance of FinFET

  • Author

    Wei-Chuan Chen ; Chang-Pao Chang ; Ming-Kai Kang ; Ting-Ui Huang ; Kai-Bin Wu ; Ruey-Beei Wu

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • fYear
    2014
  • Firstpage
    95
  • Lastpage
    98
  • Abstract
    Artificial neural networks (ANNs) have been applied as an efficient machine-learning tool to model many complex electromagnetic problems recently. This paper gives a comprehensive description on fast extraction of the extrinsic capacitance for 3D FinFET transistors using Q3D with different sizes. This extraction method is later coupled with artificial neural networks to form a controllable model with good balance between accuracy and efficiency. The error analysis of this model is also given at the end of the context..
  • Keywords
    MOSFET; capacitance; electronic engineering computing; neural nets; semiconductor device models; FinFET; Q3D; artificial neural network; extrinsic capacitance; machine learning tool; Artificial neural networks; Capacitance; Decision support systems; FinFETs; Microwave transistors; Training; Artificial Neural Networks; Extrinsic Capacitance; FinFET;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging and Systems (EPEPS), 2014 IEEE 23rd Conference on
  • Print_ISBN
    978-1-4799-3641-0
  • Type

    conf

  • DOI
    10.1109/EPEPS.2014.7103604
  • Filename
    7103604