DocumentCode
3589295
Title
Lighting the dark silicon by exploiting heterogeneity on future processors
Author
Ying Zhang ; Lu Peng ; Xin Fu ; Yue Hu
Author_Institution
Div. of Electr. & Comput. Eng., Louisiana State Univ., Baton Rouge, LA, USA
fYear
2013
Firstpage
1
Lastpage
7
Abstract
As we embrace the deep submicron era, dark silicon caused by the failure of Dennard scaling impedes us from attaining commensurate performance benefit from the increased number of transistors. To alleviate the dark silicon and effectively leverage the advantage of decreased feature size, we consider a set of design paradigms by exploiting heterogeneity in the processor manufacturing. We conduct a thorough investigation on these design patterns from different evaluation perspectives including performance, energy-efficiency, and cost-efficiency. Our observations can provide insightful guidance to the design of future processors in the presence of dark silicon.
Keywords
design engineering; integrated circuit design; microprocessor chips; silicon; Dennard scaling; cost efficiency; dark silicon; deep submicron era; energy efficiency; heterogeneity; performance; processor manufacturing; Energy efficiency; High K dielectric materials; Manufacturing; Performance evaluation; Program processors; Silicon; Dark silicon; emerging device; heterogeneous;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference (DAC), 2013 50th ACM/EDAC/IEEE
ISSN
0738-100X
Type
conf
Filename
6560675
Link To Document