Substrate selection for the optical analysis of nickel oxide thin films

The transmittance and absorbance data of nickel oxide films are crucial in determining it´s optical properties. Selection of substrate is important for a greater understanding of optical constants and properties of a material. In view of this Nickel oxide films were deposited on Quartz substrates and it´s properties are compared with Nickel oxide films deposited on glass. We show the difference in optical constants measured for Nickel oxide thin film deposited on glass and quartz substrates.