Title :
Low delay error correction codes to correct stuck-at defects and soft errors
Author :
Asuvaran, A. ; Senthilkumar, S.
Author_Institution :
Dept. of ECE, Univ. Coll. of Eng., Pattukkottai, India
Abstract :
For perfect communication during data transmission between transmitter and receiver the reliability is important factor, sometimes reliability is missed due to appearance of errors. ECC provides reliable data delivery over unreliable communication channel. Error correction codes (ECCs) are used to shield memories from soft errors and stuck-at defects. Single error correction (SEC) codes that can correct 1-bit error per word are a typical choice for memory protection. In some cases, SEC codes are extended to conjointly offer double error detection and are referred to as SEC-DED codes. Repair proficiencies are usually used for defects, whereas error correction codes are used for soft errors. Recently, some proposals are created to use error correction codes to handle with defects. In this paper tend to correct two single bit errors within the combination of one soft error and one stuck-at defect and to reduce delay of Error Correction Codes.
Keywords :
circuit reliability; error correction codes; logic circuits; radiation hardening (electronics); SEC-DED codes; delay reduction; double error detection; low delay error correction code; reliable data delivery; single error correction code; soft error correction; stuck-at defect error correction; unreliable communication channel; Computer aided software engineering; Decoding; Delays; Encoding; Error correction codes; Registers; Reliability; single error correction codes; soft errors; stuck-at defects;
Conference_Titel :
Advances in Engineering and Technology (ICAET), 2014 International Conference on
DOI :
10.1109/ICAET.2014.7105257