Title :
Implementation of channel aware scheduling and bit-loading for the multiuser SIMO MAC in a real-time MIMO demonstration test-bed at high data rate
Author :
Haustein, T. ; Zhou, C. ; Forck, A. ; G?¤bler, H. ; Helmolt, C.V. ; Jungnickel, V. ; Kr?¼ger, U.
Author_Institution :
Fraunhofer Inst. for Telecommun., Heinrich-Hertz-Inst., Berlin, Germany
Abstract :
In this paper, we discuss a cross layer approach to apply channel aware scheduling for a multi user SIMO multiple access channel. We show how optimum power and rate allocation can be achieved when successive interference cancellation (SIC) and a MMSE receiver is used at the base station. Combining these capacity optimum results with quality of service requirements of the users (e.g. data rate or delay) we analyze the joint optimization problem and propose a suboptimum but applicable scheduling approach which can be implemented already today on real time capable hardware. Different scheduling policies were implemented in the real time MIMO test-bed in our lab We describe the particular hardware setup for the experiments and present measurement results on various scheduling policies under power and bit error rate constraints with an average uplink spectral efficiency of up to 17 bits/s/Hz with 3 base station antennas.
Keywords :
MIMO systems; access protocols; cellular radio; interference suppression; least mean squares methods; multi-access systems; multiuser channels; optimisation; quality of service; radio receivers; QoS; SIC; base station MMSE receiver; bit error rate constraints; cellular systems; channel aware bit-loading; channel aware scheduling; joint optimization problem; multiuser SIMO MAC; multiuser SIMO multiple access channel; power allocation; power constraints; quality of service requirements; rate allocation; real-time MIMO; scheduling policies; successive interference cancellation; uplink spectral efficiency; Antenna measurements; Base stations; Cross layer design; Delay effects; Hardware; Interference cancellation; MIMO; Quality of service; Silicon carbide; Testing;
Conference_Titel :
Vehicular Technology Conference, 2004. VTC2004-Fall. 2004 IEEE 60th
Print_ISBN :
0-7803-8521-7
DOI :
10.1109/VETECF.2004.1400180