• DocumentCode
    3589526
  • Title

    Characterization of wideband decoupling power line with extremely low characteristic impedance for millimeter-wave CMOS circuits

  • Author

    Goda, R. ; Amakawa, S. ; Katayama, K. ; Takano, K. ; Yoshida, T. ; Fujishima, M.

  • Author_Institution
    Grad. Sch. of Adv. Sci. of Matter, Hiroshima Univ., Higashi-Hiroshima, Japan
  • fYear
    2015
  • Firstpage
    220
  • Lastpage
    223
  • Abstract
    A wideband decoupling power line for millimeter-wave circuits can be realized with a transmission line having an extremely low characteristic impedance, Z0 → 0Ω. It is, however, very difficult to characterize such a line with the ordinary two-port S-parameter measurement. This paper presents an alternative measurement technique that uses transmission line stubs. The measurement results confirm that a power line impedance below 1Ω is successfully achieved over a very wide frequency range (> 80 GHz). A measurement-based method of finding the necessary length of such a low-impedance line for realizing good decoupling is also proposed.
  • Keywords
    CMOS integrated circuits; electric impedance; field effect MIMIC; integrated circuit interconnections; characteristic impedance; low-impedance line; millimeter-wave CMOS circuits; transmission line stubs; two-port S-parameter measurement; wideband decoupling power line; CMOS integrated circuits; CMOS technology; Impedance measurement; Millimeter wave circuits; Power transmission lines; Transmission line measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Test Structures (ICMTS), 2015 International Conference on
  • ISSN
    1071-9032
  • Print_ISBN
    978-1-4799-8302-5
  • Type

    conf

  • DOI
    10.1109/ICMTS.2015.7106098
  • Filename
    7106098