Title :
Simulations of single event transient effects in the LM139 voltage comparator
Author :
Jianbo Liu ; Yuan Liu ; Jinli Cheng ; Yunfei En ; Ting Zhang ; Yujuan He
Author_Institution :
Sch. of Mater. & Energy, Guangdong Univ. of Technol., Guangzhou, China
Abstract :
Single event transient effect in the linear voltage comparator is investigated in this paper. The circuit level simulation is performed to analyze the output response of LM139 voltage comparators with single event transients (SETs). Simulation results show that input stage and two current sources are the most sensitive parts to the single event transient effects. The output responses were shown as transient pulses with different width. Based on the simulation results, the susceptive parts of a LM139 voltage comparator are acquired. Furthermore, the results above can also be helpful to further harden designs of linear ICs.
Keywords :
circuit simulation; comparators (circuits); radiation hardening (electronics); LM139 voltage comparator; SETs; circuit level simulation; current sources; linear ICs; linear voltage comparator; single event transient effect simulation; transient pulses; Analytical models; Integrated circuit modeling; Ion beams; Simulation; Single event transients; Transient analysis; Transistors; SET; circuit level simulation; output waveform; voltage comparator;
Conference_Titel :
Reliability, Maintainability and Safety (ICRMS), 2014 International Conference on
Print_ISBN :
978-1-4799-6631-8
DOI :
10.1109/ICRMS.2014.7107167
