Title :
Study on fatigue ductility coefficient and life prediction for mixed solder joints under thermal cycle loads
Author :
Bin Zhou ; Tao Lu ; Jincheng You
Author_Institution :
Sci. & Technol. on Reliability Phys. & Applic. of Electron. Component Lab., Guangzhou, China
Abstract :
Lead-free solder ball of PBGA with SnPb solder paste in the weight ratio of 1:0.5 was mounted for mixed soldering experimental sample. Temperature cycling experiment was carried out at -55 °C ~ +125 °C conditions. The event detector was employed to monitor the solder joint failure in realtime in terms of IPC-9701 standard, and the Weibull curve of mixed solder joint failure was established. Thermal fatigue ductility coefficient of mixed solder joints was deduced based on the failure data of solder joints and IPC-SM-785 standard. Moreover, the microstructure and the failure mode of mixed solder joints were analyzed during different thermal cycles using scanning electron microscopy (SEM) and energy dispersive spectroscopy (EDS). The results showed that the thermal fatigue ductility coefficient of mixed solder joints was 0.8306, which is greater than 0.325 of Sn63Pb37 solder joints because of the larger elastic modulus of mixed solder increasing its brittleness. The mixed solder joints cracking in temperature cycling test begin from the lead-rich region in corners. Crack interface presents grain boundary slip characteristics, which suggest the grain boundary dislocations caused by shear stress is still the main reason of solder joints cracking. The growth of IMC layer in mixed solder joints is not sensitive to temperature cycling condition, and there are lead-rich phase, Cu6Sn5 alloys and Ag3Sn alloys coexistence inside the mixed solder joints after thermal cycles. Further research for long-term reliability regular data is still needed.
Keywords :
X-ray chemical analysis; ball grid arrays; brittleness; copper alloys; dislocations; ductility; elastic moduli; failure analysis; grain boundaries; lead alloys; plastic packaging; scanning electron microscopy; silver alloys; soldering; solders; thermal stress cracking; tin alloys; Ag3Sn; Cu6Sn5; EDS; IMC layer growth; IPC-9701 standard; IPC-SM-785 standard; PBGA; SEM; SnPb; Weibull curve; elastic modulus; energy dispersive spectroscopy; event detector; grain boundary dislocations; grain boundary slip characteristics; lead-free solder ball; life prediction; long-term reliability regular data; microstructure; mixed solder joint cracking; mixed solder joint failure; mixed soldering experimental sample; scanning electron microscopy; solder paste; temperature cycling test; thermal cycle loads; thermal fatigue ductility coefficient; weight ratio; Fatigue; Lead; Microstructure; Reliability; Scanning electron microscopy; Soldering; Mixed solder joint; failure; fatigue ductility coefficient; thermal cycles;
Conference_Titel :
Reliability, Maintainability and Safety (ICRMS), 2014 International Conference on
Print_ISBN :
978-1-4799-6631-8
DOI :
10.1109/ICRMS.2014.7107285