• DocumentCode
    3589863
  • Title

    The study on application of HALT for DC/DC converter

  • Author

    Hui Chen ; Bin Yao ; Qingzhong Xiao

  • Author_Institution
    Sci. & Technol. on Reliability Phys. & Applic. of Electron. Component Lab., CEPREI, Guangzhou, China
  • fYear
    2014
  • Firstpage
    797
  • Lastpage
    800
  • Abstract
    DC/DC converters play the key roles in electronic systems. They often undergo the severest stress and are most likely to fail. So the research of reliability and failure analysis to the DC/DC converters is important to make products reliable and to maintain its performance under different loads. Highly accelerated limit test (HALT) is an advanced accelerated test method for reliability evaluation. In this paper, the concept meanings of HALT technology are introduced. The principle and procedure of the application of HALT for DC/DC converter are discussed. In the study, the test samples were subjected to progressively higher stress levels. Thermal dwells, rapid temperature transitions, vibration, electrical stress and a combination of different stresses were employed to evaluate the inherent defects of DC/DC converters. Several key parameters such as output voltage, efficiency and ripple were monitored to identify the operating limits and failures of the samples. Besides, in order to obtain the failure modes and mechanisms and give the improvement approaches, the method of failure analysis on the failed samples is introduced.
  • Keywords
    DC-DC power convertors; failure analysis; life testing; reliability; DC/DC converter; HALT; accelerated test method; failure analysis; highly accelerated limit test; reliability evaluation; Life estimation; Monitoring; Reliability; Stress; Temperature measurement; Temperature sensors; Vibrations; DC/DC; HALT; HASS; accelerated stress; monitor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability, Maintainability and Safety (ICRMS), 2014 International Conference on
  • Print_ISBN
    978-1-4799-6631-8
  • Type

    conf

  • DOI
    10.1109/ICRMS.2014.7107309
  • Filename
    7107309