Title :
Reliability assessment of SSADT for ammunition based on pseudo-failure life
Author :
Zhifeng Fan ; Jian Wen ; Ping Cui ; Jingqing Xu
Author_Institution :
Mech. Eng. Coll., Shijiazhuang, China
Abstract :
In order to assess the storage reliability of ammunition contained electronic components rapidly, the method of step-stress accelerated degradation testing (SSADT) is presented. First the scheme of SSADT and the train of thoughts of reliability assessment are expatiated. Then the basic hypotheses of reliability assessment of SSADT for ammunition based on pseudo-failure life are put forward. And the method of reliability assessment of SSADT for ammunition based on pseudo-failure life is analyzed particularly. Compared with accelerated life testing, the method of SSADT for ammunition can decrease testing time to a great extent while not increase the sample size, so it has a higher cost-effective ratio.
Keywords :
failure analysis; life testing; reliability; weapons; SSADT; accelerated life testing; ammunition contained electronic components; cost-effective ratio; pseudofailure life; reliability assessment; step-stress accelerated degradation testing; storage reliability; Degradation; Electronic components; Life estimation; Reliability; Stress; Testing; Trajectory; Ammunition; Constant-stress accelerated degradation testing (CSADT); Pseudo-failure life; Reliability assessment; Step-stress accelerated degradation testing (SSADT);
Conference_Titel :
Reliability, Maintainability and Safety (ICRMS), 2014 International Conference on
Print_ISBN :
978-1-4799-6631-8
DOI :
10.1109/ICRMS.2014.7107315
